Jean-François TAHON - Université de Lille

Jean-François TAHON

Ingeenier

Bât C6 bureau 215
Unité Matériaux et Transformations
Cité scientifique, Bât. C6
Université de Lille
59655 Villeneuve d'Ascq
France
Tel: 03 20 33 62 04
Fax: +33 (0) 320 43 65 91
Email

: Send an email to Jean-François TAHON
ORCID Identifier

: 0000-0002-5799-9586

Research team: Ingénierie des systèmes polymères

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Differential scanning calorimetry

Research team: Ingénierie des systèmes polymères.

Contact: Jean-François TAHON.

DSC with power compensation, PERKIN ELMER, (-180 ° C to 400 ° C).

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Differential scanning calorimetry Q2000

Research team: Ingénierie des systèmes polymères.

Contact: Jean-François TAHON.

DSC modulated heat flux, TA instrument, Q2000, (-90 ° to 400 ° C).

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Electrical measuring bench

Research team: Ingénierie des systèmes polymères.

Contacts: Jean-François BRUN, Jean-François TAHON.

4-point measurement system (SUSS MICROTEC EP6) coupled to Keithley electrical measuring instruments (2635 and 2400 flowmeter, DC and AC 6221 current source, 218C nanovolometer)

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Measuring bench of the Seebeck coefficient

Research team: Ingénierie des systèmes polymères.

Contacts: Jean-François BRUN, Jean-François TAHON.

Seebeck coefficient bench for pellets and thin films

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Thermal Conductivity Thin Film Measurement Bench

Research team: Ingénierie des systèmes polymères.

Contacts: Jean-François BRUN, Jean-François TAHON.

Synchronous detection system, AMETEK 7270 with vacuum pumping bench allowing thermal conductivity measurements by the 3ω method

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Thin film analyzer

Research team: Ingénierie des systèmes polymères.

Contacts: Jean-François BRUN, Jean-François TAHON.

Thin Film Analyzer (TFA), LINSEIS
Thermoelectric measurement bench: measures thermal conductivity, electrical conductivity and Seebeck coefficient on thin layers and simultaneous

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Turntable

Research team: Ingénierie des systèmes polymères.

Contact: Jean-François TAHON.

Turntable (KARL SUSS RC8)

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$X-Ray Diffusion/Diffraction bench, Xeuss2.0 (Xenocs)$

X-Ray Diffusion/Diffraction bench, Xeuss2.0 (Xenocs)

Research team: Ingénierie des systèmes polymères.

Platform: Plateau dâ€™analyses par diffraction des Rayons X.

Contacts: Jean-François TAHON, Grégory STOCLET.

SAXS and WAXS Small and Large Angle Bench with Cu Microsource XENOCS with a CCD detector PILATUS 200K.

Specificities and equipments :

Transmission measurements with sample gates for solids, powders, capillaries and liquids with the possibility of varying the temperature from -180 ° C to 350 ° C.
The instrument is equipped to perform GiSAXS / GiWAXS thin-layer measurements.

Instruments in charge

Differential scanning calorimetry, Differential scanning calorimetry Q2000, Electrical measuring bench, Measuring bench of the Seebeck coefficient, Thermal Conductivity Thin Film Measurement Bench, Thin film analyzer, Turntable, X-Ray Diffusion/Diffraction bench, Xeuss2.0 (Xenocs)
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Unité Matériaux et Transformations
CNRS UMR 8207 - Université de Lille

Unité Matériaux et Transformations
CNRS UMR 8207 - Université de Lille